7-Lecture 07 - Microscopical characterisation of nanoparticles I/ClipID:17638 previous clip next clip

Recording date 2020-06-11

Via

Studon

Language

English

Organisational Unit

Professur für Nanostructured Particles

Producer

Professur für Nanostructured Particles

Format

lecture

Content and timings:

Introduction and Exam information:
02:05 - MAP students
04:57 - Nanotechnologie students
06:55 - All other students

Lecture:
08:01 - Microscopical characterisation of nanoparticles: Recommended literature (Slide 6)
09:50 - Microscopical characterisation of nanoparticles: Motivation (Slide 7)
15:35 - Sample preparation (Slide 8)
21:37 - Microscopy basics  (definition of magnification, contrast, resolution) (Slide 9)
28:08 - Transmission/Reflection microscopy: General arrangment (Slide 10)
31:33 - Resolution limit in transmission/reflection microscopy (Slide 11) 
41:55 - Optical (visible light) microscopy of nanoparticles (Slide 14)
44:21 - Demonstration of a simple ultramicroscope for nanoparticle observation (Slide 15)
47:48 - Nanoparticle tracking analysis (Slide 16)
51:25 - Single particle scattering spectroscopy (Slide 17)
59:10 - "Seeing" nanoparticles with normal optical microscopy (Slide 21)
1:02:00 - Electron microscopy: Electron-specimen interactions (Slide 23)
1:05:09 - Introduction to the transmission electron microscope (Slide 24)
1:13:57 - TEM Sample Preparation (Slide 27)
1:16:20 - Bright field imaging (one of two diffraction contrast imaging modes) (Slide 28)
1:24:37 - Dark field imaging (one of two diffraction contrast imaging modes) (Slide 32)
1:28:05 - High resolution TEM imaging mode (Phase contrast mode) (Slide 35)
1:37:37 - Three definitions for the resolution of the TEM (Slide 40)

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