8 - Lecture 08 - Microscopical characterisation of nanoparticles II/ClipID:16362 previous clip next clip

Recording date 2020-06-19

Language

English

Organisational Unit

Professur für Nanostructured Particles

Producer

Professur für Nanostructured Particles

Format

lecture

Content and Timings

0:00 - Introduction and summary of the previous lecture

12:00 - Electron energy loss spectroscopy (EELS) and energy filtered TEM (EFTEM)

18:00 - Liquid cell TEM

27:47 - Conclusion TEM (advantages and disadvantages)

31:05 - Scanning microscopy: Introduction

33:00 - Laser scanning confocal microscopy (often just called "confocal microscopy")

44:03 - Stimulated emission depletion (STED) microscopy

48:10 - Scanning transmission electron microscopy (STEM), especially High Angle Annular Dark Field (HAADF) STEM

51:00 - Electron tomography

56:25 - Energy Dispersive X-ray Spectroscopy (EDXS) N.B. at a certain point I mentioned WDS without explanation, (due to limited time). WDS (or WDXS) is wavelength dispersive  X-ray spectroscopy. The difference between the two is how the x-rays from the sample are differentiated. In EDXS we directly measure the x-rays with a solid state detector. This is sensitive to the energy of the x-rays. In WDXS we reflect the x-rays from a crystal first. This acts rather like a monochromator in a conventional spectrophotometer and separates the x-rays according to wavelength. This results in a much better resolution of the x-ray lines and therefore much more accurate identification of the chemical composition of the sample.

1:00:22 - Scanning electron microscopy  

1:09:00 - Comparison of backscattered electron and secondary electron imaging in the SEM

1:12:57 - Example of how the accelerating voltage in SEM can be important

1:15:56 - Getting statistical particle size and morphology information from SEM images

1:21:58 - Conclusion SEM (advantages and disadvantages)

1:24:16 - Scanning (physical) probe microscopy

1:26:40 - Scanning tunneling microscopy (STM)

1:31:30 - Atomic force microscopy (AFM) 

1:34:49 - Scanning near-field optical microscopy (SNOM/NSOM)

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